X-Series
X-300 to sort out aluminum alloys with low % Mg, is faster and more precise than the other models. X-200 is cheaper and smaller than the X-300. X-100 same as the X-200 for elements titanium and higher. X-50: The PiN diode technology for analyzing basic alloys including stainless, high temps, copper alloys. The X-550 is designed for NDT, PMI users who must access hard-to-reach test locations and welds. The X-550 also features a powerful, miniaturized X-ray tube designed for measuring low atomic number elements Si, P, S, Mg and Al. The X-555 contains LIBS along with XRF, detecting Mg through U.
Availability: Commercially Available
| Manufacturer |
| SciAps, Inc. |
| Product Name |
| X-Series |
| Detection Category |
| Chemical; Explosives |
| Detection Principle |
| Elemental Analysis; |
| Detection Method |
| X-ray Fluorescence; |
| Application |
| Screening;Bulk Analysis; |
| Product Model Number |
| X-100, X-200, X-300, X-50, X-505, X-550, X-555 |
| Equipment Type |
| Instrument |
| Product Synopsis |
| X-300 to sort out aluminum alloys with low % Mg, is faster and more precise than the other models. X-200 is cheaper and smaller than the X-300. X-100 same as the X-200 for elements titanium and higher. X-50: The PiN diode technology for analyzing basic alloys including stainless, high temps, copper alloys. The X-550 is designed for NDT, PMI users who must access hard-to-reach test locations and welds. The X-550 also features a powerful, miniaturized X-ray tube designed for measuring low atomic number elements Si, P, S, Mg and Al. The X-555 contains LIBS along with XRF, detecting Mg through U. |
| Availability |
| Commercially Available |