D2 PHASER

The novel D2 PHASER with XFlash detector represents the first benchtop system offering X-ray diffraction (XRD), energy-dispersive X-ray diffraction (EDXRD) as well as simultaneous X-ray fluorescence (XRF) measurements under ambient conditions. Based on Bruker’s Silicon Drift technology, the XFlash detector features resolution of less than 180 eV (CuKa) at count rate levels of more than 100.000 cps.

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Availability: Commercially Available

Frank Thibodeau
Vice President of Business Development
frank.thibodeau@brukerdetection.us
+1 978 663 3660
40 Manning Road
Billerica, MA 01821
USA
Bruker Daltonics, Inc.
www.bruker.com
Manufacturer
Bruker Corporation
Product Name
D2 PHASER
Detection Category
Chemical; Explosives;
Detection Principle
ELEMENTAL ANALYSIS;
Detection Method
X-ray Diffraction (XRD); X-ray Fluorescence;
Application
Laboratory Analysis; Bulk Analysis;
Equipment Type
Instrument
Product Synopsis
The novel D2 PHASER with XFlash detector represents the first benchtop system offering X-ray diffraction (XRD), energy-dispersive X-ray diffraction (EDXRD) as well as simultaneous X-ray fluorescence (XRF) measurements under ambient conditions. Based on Bruker’s Silicon Drift technology, the XFlash detector features resolution of less than 180 eV (CuKa) at count rate levels of more than 100.000 cps.
Availability
Commercially Available
Technology Readiness Level (TRL)
9
Weight
>50 lbs.
Transportability
Benchtop/Fixed
Operating Conditions
0 to 35°C (32 to 95°F); max. 90% RH
Data Analysis Support Equipment
PC
Communications Interface
Yes
Other Chemical Targets
Elemental range: K to Hf (~3 to 20 keV)
Sample Introduction
Solid; Liquid
Sensitivity/Detection Limits
Bulk; (>mg)
Response Time (Sample Application To Output)
<5 minutes
Alarm Capability
No
Software Control
Yes
Training Required
<1 week training
Training Available
Yes
Manuals Available
Yes
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